Survey of Scan Chain Diagnosis

IEEE Design & Test of Computers 2008 Vol. 25; Iss. 3

Survey of Scan Chain Diagnosis

Yu Huang, Ruifeng Guo, Wu-Tung Cheng, Li, J.C.-M.
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Volume:
25
Year:
2008
Language:
english
DOI:
10.1109/mdt.2008.83
File:
PDF, 502 KB
english, 2008
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