Volume 25; Issue 3

IEEE Design & Test of Computers

Volume 25; Issue 3
1

Advertisers' Index

Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 157 KB
english, 2008
2

Bugs, moths, grasshoppers, and whales

Marinissen, Erik Jan
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 99 KB
english, 2008
3

Build Your Career ad

Journal:
IEEE Design & Test of Computers
Year:
2008
File:
PDF, 250 KB
2008
4

Case Study on Speed Failure Causes in a Microprocessor

Killpack, K., Natarajan, S., Krishnamachary, A., Bastani, P.
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 626 KB
english, 2008
5

CEDA Currents

Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 98 KB
english, 2008
6

DATC Newsletter

Damore, Joe
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 99 KB
english, 2008
7

Effective silicon debug is key for time to money

Cheng, Tim
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 119 KB
english, 2008
8

[Front cover]

Journal:
IEEE Design & Test of Computers
Year:
2008
File:
PDF, 1.96 MB
2008
9

Functional Debug Techniques for Embedded Systems

Vermeulen, B.
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 969 KB
english, 2008
11

IEEE Computer Graphics 2008 Editorial Calendar

Journal:
IEEE Design & Test of Computers
Year:
2008
File:
PDF, 246 KB
2008
12

IEEE Computer Society Digital Library ad

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IEEE Design & Test of Computers
Year:
2008
File:
PDF, 2.01 MB
2008
13

IEEE Computer Society Information

Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 156 KB
english, 2008
14

IEEE Computer Society Membership ad

Journal:
IEEE Design & Test of Computers
Year:
2008
File:
PDF, 338 KB
2008
15

IEEE Computer Society Membership and Subscriptions form

Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 584 KB
english, 2008
16

IEEE Computer Society Membership Information

Journal:
IEEE Design & Test of Computers
Year:
2008
File:
PDF, 413 KB
2008
17

IEEE Distributed Systems Online ad

Journal:
IEEE Design & Test of Computers
Year:
2008
File:
PDF, 304 KB
2008
18

IEEE Pervasive Computing ad

Journal:
IEEE Design & Test of Computers
Year:
2008
File:
PDF, 274 KB
2008
19

IEEE Software 2008 Editorial Calendar

Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 366 KB
english, 2008
20

In-System Silicon Validation and Debug

Abramovici, M.
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 853 KB
english, 2008
22

Linking Statistical Learning to Diagnosis

Bastani, P., Wang, L.-C., Abadir, M.S.
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 719 KB
english, 2008
23

Masthead

Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 111 KB
english, 2008
24

Overview of Debug Standardization Activities

Vermeulen, B., Stollon, N., Kuhnis, R., Swoboda, G., Rearick, J.
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 985 KB
english, 2008
25

Physical Techniques for Chip-Backside IC Debug in Nanotechnologies

Boit, C., Schlangen, R., Kerst, U., Lundquist, T.
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 642 KB
english, 2008
26

Survey of Scan Chain Diagnosis

Yu Huang, Ruifeng Guo, Wu-Tung Cheng, Li, J.C.-M.
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 502 KB
english, 2008
27

Table of Contents

Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 433 KB
english, 2008
28

Thousand-Core Chips [Roundtable]

Yeh, David, Peh, Li-Shiuan, Borkar, Shekhar, Darringer, John, Agarwal, Anant, Hwu, Wen-mei
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 402 KB
english, 2008
29

TTTC Newsletter

Kim, Bruce C.
Journal:
IEEE Design & Test of Computers
Year:
2008
Language:
english
File:
PDF, 212 KB
english, 2008