Application of hardness-by-design methodology to radiation-tolerant ASIC technologies
Lacoe, R.C., Osborn, J.V., Koga, R., Brown, S., Mayer, D.C.Volume:
47
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.903774
Date:
January, 2000
File:
PDF, 138 KB
english, 2000