Volume 47; Issue 6

1

Analysis of SEB and SEGR in super-junction MOSFETs

Year:
2000
Language:
english
File:
PDF, 904 KB
english, 2000
3

Mechanism for single-event burnout of bipolar transistors

Year:
2000
Language:
english
File:
PDF, 91 KB
english, 2000
5

Radiation effects in a CMOS active pixel sensor

Year:
2000
Language:
english
File:
PDF, 94 KB
english, 2000
7

A model for single-event transients in comparators

Year:
2000
Language:
english
File:
PDF, 174 KB
english, 2000
8

Proposal for a new room temperature X-ray detector-thallium lead iodide

Year:
2000
Language:
english
File:
PDF, 254 KB
english, 2000
10

A digital CMOS design technique for SEU hardening

Year:
2000
Language:
english
File:
PDF, 156 KB
english, 2000
22

Impact of CMOS technology scaling on the atmospheric neutron soft error rate

Year:
2000
Language:
english
File:
PDF, 293 KB
english, 2000
25

The impact of single event gate rupture in linear devices

Year:
2000
Language:
english
File:
PDF, 189 KB
english, 2000
27

Characterization of proton damage in light-emitting diodes

Year:
2000
Language:
english
File:
PDF, 128 KB
english, 2000
29

Cosmic ray neutron multiple-upset measurements in a 0.6-μm CMOS process

Year:
2000
Language:
english
File:
PDF, 260 KB
english, 2000
32

Nuclear emulsion readout techniques developed for the CHORUS experiment

Year:
2000
Language:
english
File:
PDF, 476 KB
english, 2000
34

Modeling and simulation of a readout architecture for pixel detectors

Year:
2000
Language:
english
File:
PDF, 568 KB
english, 2000
35

Operation of a CCD particle detector in the presence of bulk neutron damage

Year:
2000
Language:
english
File:
PDF, 382 KB
english, 2000
39

Sol-gel coating of scintillating crystals

Year:
2000
Language:
english
File:
PDF, 328 KB
english, 2000
47

The design of the CDF Run 2 calorimetry readout module

Year:
2000
Language:
english
File:
PDF, 375 KB
english, 2000
49

Development of a compact single ion irradiation system

Year:
2000
Language:
english
File:
PDF, 409 KB
english, 2000
50

Position of ion impact determined via detection of secondary electrons

Year:
2000
Language:
english
File:
PDF, 489 KB
english, 2000
65

Development of scintillating fiber imager

Year:
2000
Language:
english
File:
PDF, 442 KB
english, 2000
75

High-energy proton-induced dark signal in silicon charge coupled devices

Year:
2000
Language:
english
File:
PDF, 162 KB
english, 2000
80

DNB limit estimation using an adaptive fuzzy inference system

Year:
2000
Language:
english
File:
PDF, 562 KB
english, 2000
82

Development of high gain GEM detectors

Year:
2000
Language:
english
File:
PDF, 587 KB
english, 2000
84

Simplified, solid-state, wide-range, stack-gas monitor for nuclear power plants

Year:
2000
Language:
english
File:
PDF, 582 KB
english, 2000
91

A two-dimensional beam profile monitor based on residual gas ionization

Year:
2000
Language:
english
File:
PDF, 368 KB
english, 2000
104

Electron collision dose enhancement

Year:
2000
Language:
english
File:
PDF, 178 KB
english, 2000
110

Radiation-induced dark current in CMOS active pixel sensors

Year:
2000
Language:
english
File:
PDF, 129 KB
english, 2000
114

Effects of inhomogeneity in plane shielding construction

Year:
2000
Language:
english
File:
PDF, 267 KB
english, 2000
119

Heavy ion irradiation of thin gate oxides

Year:
2000
Language:
english
File:
PDF, 171 KB
english, 2000
125

A generation of CMOS readout ASICs for CZT detectors

Year:
2000
Language:
english
File:
PDF, 1.11 MB
english, 2000
131

Adaptive digital spectroscopy in programmable logic

Year:
2000
Language:
english
File:
PDF, 198 KB
english, 2000
138

Subject index

Year:
2000
File:
PDF, 285 KB
2000
144

Conference author index

Year:
2000
File:
PDF, 135 KB
2000
148

The Sudbury Neutrino Observatory

Year:
2000
Language:
english
File:
PDF, 515 KB
english, 2000
149

The 1998 Nuclear Science Symposium

Year:
2000
Language:
english
File:
PDF, 207 KB
english, 2000
151

Analysis of radiation effects on individual DRAM cells

Year:
2000
Language:
english
File:
PDF, 92 KB
english, 2000
155

In-flight observations of multiple-bit upset in DRAMs

Year:
2000
Language:
english
File:
PDF, 443 KB
english, 2000
157

Universal damage factor for radiation-induced dark current in silicon devices

Year:
2000
Language:
english
File:
PDF, 192 KB
english, 2000
158

The 2000 IEEE Nuclear and Space Radiation Effects Conference

Year:
2000
Language:
english
File:
PDF, 348 KB
english, 2000
159

Conference author index

Year:
2000
File:
PDF, 128 KB
2000
160

Author index

Year:
2000
Language:
english
File:
PDF, 245 KB
english, 2000
161

Conference author index

Year:
2000
Language:
english
File:
PDF, 154 KB
english, 2000
162

1999 nuclear science symposium

Year:
2000
Language:
english
File:
PDF, 225 KB
english, 2000