Single-event upset and snapback in silicon-on-insulator...

IEEE Transactions on Nuclear Science 2000 / Dec. Vol. 47; Iss. 6

Single-event upset and snapback in silicon-on-insulator devices and integrated circuits

Dodd, P.E., Shaneyfelt, M.R., Walsh, D.S., Schwank, J.R., Hash, G.L., Loemker, R.A., Draper, B.L., Winokur, P.S.
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Volume:
47
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.903749
Date:
January, 2000
File:
PDF, 162 KB
english, 2000
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