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Point Defects Interaction with Extended Defects and Impurities and Its Influence on the Si-SiO2 System Properties
Kropman, Daniel, Abru, U., Kärner, T., Ugaste, U., Mellikov, E., Kauk, M., Heinmaa, I., Samoson, A., Medvid, ArthurVolume:
108-109
Year:
2005
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.108-109.333
File:
PDF, 316 KB
english, 2005