Volume 108-109

Solid State Phenomena

Volume 108-109
11

Use of the Nitride to Reduce High-K Secondary Effects in Submicron MOSFETs

Year:
2005
Language:
english
File:
PDF, 349 KB
english, 2005
12

Interfacing Biology with Electronic Devices

Year:
2005
Language:
english
File:
PDF, 919 KB
english, 2005
19

Silicon Based Light Emitters for On-Chip Optical Interconnects

Year:
2005
Language:
english
File:
PDF, 466 KB
english, 2005
31

Control of Oxygen Precipitation in Silicon by Infrared Laser Irradiation

Year:
2005
Language:
english
File:
PDF, 287 KB
english, 2005
37

Study of Au Diffusion in Nitrogen-Doped FZ Si

Year:
2005
Language:
english
File:
PDF, 271 KB
english, 2005
48

Novel Low-K Dielectric Obtained by Xenon Implantation in SiO2

Year:
2005
Language:
english
File:
PDF, 4.01 MB
english, 2005
49

Characterization of SiGe Layer on Insulator by In-Plane Diffraction Method

Year:
2005
Language:
english
File:
PDF, 445 KB
english, 2005
59

Dislocation Related PL of Multi-Step Annealed Cz-Si Samples

Year:
2005
Language:
english
File:
PDF, 835 KB
english, 2005
63

EBIC and DLTS Study of Deformation Induced Defect Thermal Stability in n-Si

Year:
2005
Language:
english
File:
PDF, 1.44 MB
english, 2005
64

Electrical Passivation of Silicon Wafers

Year:
2005
Language:
english
File:
PDF, 653 KB
english, 2005
82

Pulsed Laser Deposition of Hafnium Oxide on Silicon

Year:
2005
Language:
english
File:
PDF, 720 KB
english, 2005
84

Amorphisation and Recrystallisation of Nanometre Sized Zones in Silicon

Year:
2005
Language:
english
File:
PDF, 1.03 MB
english, 2005
87

Thin SiGe Relaxed Buffer for Strain Adjustment

Year:
2005
Language:
english
File:
PDF, 360 KB
english, 2005
91

Atomic Environment of Positrons Annihilating in HT Cz-Si Crystal

Year:
2005
Language:
english
File:
PDF, 359 KB
english, 2005
100

Atomistic Nanodevice Simulation

Year:
2005
Language:
english
File:
PDF, 123 KB
english, 2005
102

Energetics and Kinetics of Defects and Impurities in Silicon from Atomistic Calculations

Year:
2005
Language:
english
File:
PDF, 2.46 MB
english, 2005
105

Structural Characterization of Epitaxial Si / Pr2O3 / Si(111) Heterostructures

Year:
2005
Language:
english
File:
PDF, 836 KB
english, 2005
106

Infrared Absorption Measurement of Carbon Concentration down to 1x1014/cm3 in CZ Silicon

Year:
2005
Language:
english
File:
PDF, 332 KB
english, 2005
112

Cobalt Contamination in Silicon

Year:
2005
Language:
english
File:
PDF, 548 KB
english, 2005
114

Defect Formation in MBE Er-Doped Si Light-Emitting Structures

Year:
2005
Language:
english
File:
PDF, 10.00 MB
english, 2005
115

Potential and Limitations of Electron Holography in Silicon Research

Year:
2005
Language:
english
File:
PDF, 1.02 MB
english, 2005
120

Microscopic Mechanisms of Cobalt Disilicide Nucleation in Silicon

Year:
2005
Language:
english
File:
PDF, 1.07 MB
english, 2005