Characterization and modeling of low frequency noise in...

Solid-State Electronics 2013 / 3 Vol. 81

Characterization and modeling of low frequency noise in CMOS inverters

Ioannidis, E.G., Haendler, S., Dimitriadis, C.A., Ghibaudo, G.
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Volume:
81
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2012.12.001
Date:
March, 2013
File:
PDF, 539 KB
english, 2013
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