Single-Event Burnout and Avalanche Characteristics of Power...

IEEE Transactions on Nuclear Science 2006 / 12 Vol. 53; Iss. 6

Single-Event Burnout and Avalanche Characteristics of Power DMOSFETs

Liu, Sandra, Boden, Milton, Girdhar, Dev Alok, Titus, Jeffrey L.
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Volume:
53
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2006.884971
Date:
December, 2006
File:
PDF, 396 KB
english, 2006
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