Quantitative Aberration-corrected Transmission Electron...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S03

Quantitative Aberration-corrected Transmission Electron Microscopy

Houben, L., Jia, C. L., Tillmann, K., Urban, K.
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Volume:
10
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927604555745
Date:
August, 2004
File:
PDF, 2.37 MB
2004
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