Volume 10; Issue S03

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Microscopy and Microanalysis
Volume 10; Issue S03

Microscopy and Microanalysis

Volume 10; Issue S03

1

Quantitative Aberration-corrected Transmission Electron Microscopy

Houben, L., Jia, C. L., Tillmann, K., Urban, K.

Journal:

Microscopy and Microanalysis

Year:

2004

File:

PDF, 2.37 MB

2004

2

Outline of the Mirror Corrector for SMART and PEEM3

Rose, Harald, Hartel, Peter, Preikszas, Dirk

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 181 KB

english, 2004

3

Aberration Minimized FESEM for Nanotechnology Applications

Boyes, Edward D.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 164 KB

english, 2004

4

In Situ Experiments in the High-Voltage Microscope in Stuttgart: Need for Better Resolution?

Rühle, Manfred

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 128 KB

english, 2004

5

Electron Holography with Cs-corrected TEM

Lichte, Hannes, Geiger, Dorin, Lehmann, Michael, Haider, Max, Freitag, Bert

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 212 KB

english, 2004

6

Image-Based Nanocrystallography by Means of Transmission Electron Goniometry

Moeck, Peter, Seipel, Bjoern, Qin, Wentao, Fraundorf, Philip B.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 138 KB

english, 2004

7

A New Approach for Electron Tomography: ADF-TEM

Bals, S., Radmilovic, V., Yang, Q., Kisielowski, C.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 216 KB

english, 2004

8

HRTEM Image Simulation of Carbon Nanotubes Under Actual Growth Environment

Takeda, S., Yoshida, H.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 613 KB

english, 2004

9

Toward Ultrafast Electron Microscopy

King, Wayne E., Campbell, Geoffrey H., Frank, Alan, Reed, Bryan, Schmerge, John, Siwick, Bradley, Stuart, Brent, Weber, Peter

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 84 KB

english, 2004

10

The Dynamics of Nano-oxidation Reactions Visualized by in situ UHV-TEM

Yang, Judith C.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 350 KB

english, 2004

11

Retrieving Potential Maps from Reversed Multislice Calculations

Chen, Fu-Rong, Kisielowski, Christian, Jinschek, Joerg R., Plitzko, Juergen, Kai, Ji-Jung

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 406 KB

english, 2004

12

Sub-[Angstrom capital A, ring]ngstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes using the A-OK Standard Test Specimens

Allard, Lawrence F., O'Keefe, Michael A.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 245 KB

english, 2004

13

Sub-[Angstrom capital A, ring]ngstrom Resolution with Aberration-Corrected TEM: Present and Future

O'Keefe, Michael A.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 158 KB

english, 2004

14

Design of an Electron Optical System for the Correction of the Chromatic Aberration Cc of a TEM Objective Lens

Haider, Max, Müller, Heiko

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 415 KB

english, 2004

15

First experimental proof of spatial resolution improvement in a monochromized and Cs-corrected TEM

Freitag, B., Kujawa, S., Mul, P. M., Tiemeijer, P. C.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 1.44 MB

english, 2004

16

Prospects for Bright Field and Dark Field Electron Tomography on a Discrete Grid

Jinschek, J. R., Batenburg, K. J., Calderon, H. A., Van Dyck, D., Chen, F.-R., Radmilovic, V., Kisielowski, C.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 1.16 MB

english, 2004

17

Aberration-Corrected Electron Microscopy in Nanocatalysis

Gai, Pratibha L.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 391 KB

english, 2004

18

Potential for Optical Sectioning in Aberration-Corrected Z-contrast STEM

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 274 KB

english, 2004

19

Correction of Spherical Aberration in a Focused Ion Beam System by Means of Space Charge

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 169 KB

english, 2004

20

Materials Applications of Aberration-Corrected STEM

Pennycook, S. J., Chisholm, M. F., Varela, M., Lupini, A. R., Borisevich, A., Peng, Y., Van Benthem, K., Shibata, N., Dravid, V. P., Prabhumirashi, P., Findlay, S. D., Oxley, M. P., Allen, L. J., Dell

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 1.78 MB

english, 2004

21

Erosion of TEM Specimens in an Intense Electron Beam

Egerton, R. F., Crozier, P. A.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 155 KB

english, 2004

22

Aberration correction: Some Advantages and Alternatives

Dunin-Borkowski, R. E., Kasama, T., Cervera, L., Twitchett, A. C., Midgley, P. A., Robins, A. C., Smith, D. W., Gronsky, J. J., Thomas, C. M., Fischione, P. E., Hetherington, C. J. D., Kirkland, A. I.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 827 KB

english, 2004

23

Magnetic Imaging of Information Storage Materials

Petford-Long, A. K., Brown, H. L., Hodge, G., Warot, B., Keif, M. T., Nickel, J.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 263 KB

english, 2004

24

In Situ PEEL Spectroscopic Determination and EFTEM Imaging of Multiple Materials Properties at the Nanoscale Using Universality and Scaling in Solid-State Property-Plasmon Energy Relationships: New Capabilities for Analytical Electron Microscopy

Oleshko, Vladimir P., Howe, James M.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 388 KB

english, 2004

25

The Possibility of TEM-based X-ray Microanalysis with a Microcalorimeter Detector

Kenik, E. A., Anderson, I. M., Joy, D. C., Demers, H.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 331 KB

english, 2004

26

Atomic Resolution Electron Tomography: A Dream?

Van Dyck, D., Van Aert, S., Croitoru, M.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 158 KB

english, 2004

27

SCEM and XEDS in the Next Generation Aberration Corrected Microscopes

Zaluzec, Nestor J.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 522 KB

english, 2004

28

Outlook of Application of Aberration Corrected-Electron Microscopy in the Ligandprotected Metal Clusters

Xu, Huiping, Twesten, Ray D., Menard, Laurent, Frenkel, Anatoly, Nuzzo, Ralph, Johnson, Duane, Yang, Judith C.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 563 KB

english, 2004

29

Monochromated ELS: History, Context and Opportunities

Spence, J. C. H.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 236 KB

english, 2004

30

Sub-[Angstrom capital A, ring]ngstrom and sub-eV resolution with the analytical SATEM

Benner, G., Matijevic, M., Orchowski, A., Schlossmacher, P., Thesen, A., Haider, M., Hartel, P.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 487 KB

english, 2004

31

Prospects for Aberration Corrected Nanocrystallogrphy

Marks, L. D., Own, C. S., Sinkler, W.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 57 KB

english, 2004

32

A New Double-Corrected HREM/STEM and its Applications for Advanced Materials

Hutchison, J. L., Titchmarsh, J. M., Cockayne, D. J. H., Hetherington, C. J. D., Kirkland, A. I., Doole, R. M., Sawada, H.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 489 KB

english, 2004