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Volume 10; Issue S03
Main
Microscopy and Microanalysis
Volume 10; Issue S03
Microscopy and Microanalysis
Volume 10; Issue S03
1
Quantitative Aberration-corrected Transmission Electron Microscopy
Houben, L.
,
Jia, C. L.
,
Tillmann, K.
,
Urban, K.
Journal:
Microscopy and Microanalysis
Year:
2004
File:
PDF, 2.37 MB
Your tags:
2004
2
Outline of the Mirror Corrector for SMART and PEEM3
Rose, Harald
,
Hartel, Peter
,
Preikszas, Dirk
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 181 KB
Your tags:
english, 2004
3
Aberration Minimized FESEM for Nanotechnology Applications
Boyes, Edward D.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 164 KB
Your tags:
english, 2004
4
In Situ Experiments in the High-Voltage Microscope in Stuttgart: Need for Better Resolution?
Rühle, Manfred
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 128 KB
Your tags:
english, 2004
5
Electron Holography with Cs-corrected TEM
Lichte, Hannes
,
Geiger, Dorin
,
Lehmann, Michael
,
Haider, Max
,
Freitag, Bert
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 212 KB
Your tags:
english, 2004
6
Image-Based Nanocrystallography by Means of Transmission Electron Goniometry
Moeck, Peter
,
Seipel, Bjoern
,
Qin, Wentao
,
Fraundorf, Philip B.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 138 KB
Your tags:
english, 2004
7
A New Approach for Electron Tomography: ADF-TEM
Bals, S.
,
Radmilovic, V.
,
Yang, Q.
,
Kisielowski, C.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 216 KB
Your tags:
english, 2004
8
HRTEM Image Simulation of Carbon Nanotubes Under Actual Growth Environment
Takeda, S.
,
Yoshida, H.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 613 KB
Your tags:
english, 2004
9
Toward Ultrafast Electron Microscopy
King, Wayne E.
,
Campbell, Geoffrey H.
,
Frank, Alan
,
Reed, Bryan
,
Schmerge, John
,
Siwick, Bradley
,
Stuart, Brent
,
Weber, Peter
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 84 KB
Your tags:
english, 2004
10
The Dynamics of Nano-oxidation Reactions Visualized by in situ UHV-TEM
Yang, Judith C.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 350 KB
Your tags:
english, 2004
11
Retrieving Potential Maps from Reversed Multislice Calculations
Chen, Fu-Rong
,
Kisielowski, Christian
,
Jinschek, Joerg R.
,
Plitzko, Juergen
,
Kai, Ji-Jung
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 406 KB
Your tags:
english, 2004
12
Sub-[Angstrom capital A, ring]ngstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes using the A-OK Standard Test Specimens
Allard, Lawrence F.
,
O'Keefe, Michael A.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 245 KB
Your tags:
english, 2004
13
Sub-[Angstrom capital A, ring]ngstrom Resolution with Aberration-Corrected TEM: Present and Future
O'Keefe, Michael A.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 158 KB
Your tags:
english, 2004
14
Design of an Electron Optical System for the Correction of the Chromatic Aberration Cc of a TEM Objective Lens
Haider, Max
,
Müller, Heiko
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 415 KB
Your tags:
english, 2004
15
First experimental proof of spatial resolution improvement in a monochromized and Cs-corrected TEM
Freitag, B.
,
Kujawa, S.
,
Mul, P. M.
,
Tiemeijer, P. C.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 1.44 MB
Your tags:
english, 2004
16
Prospects for Bright Field and Dark Field Electron Tomography on a Discrete Grid
Jinschek, J. R.
,
Batenburg, K. J.
,
Calderon, H. A.
,
Van Dyck, D.
,
Chen, F.-R.
,
Radmilovic, V.
,
Kisielowski, C.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 1.16 MB
Your tags:
english, 2004
17
Aberration-Corrected Electron Microscopy in Nanocatalysis
Gai, Pratibha L.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 391 KB
Your tags:
english, 2004
18
Potential for Optical Sectioning in Aberration-Corrected Z-contrast STEM
Voyles, P. M.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 274 KB
Your tags:
english, 2004
19
Correction of Spherical Aberration in a Focused Ion Beam System by Means of Space Charge
Orloff, Jon
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 169 KB
Your tags:
english, 2004
20
Materials Applications of Aberration-Corrected STEM
Pennycook, S. J.
,
Chisholm, M. F.
,
Varela, M.
,
Lupini, A. R.
,
Borisevich, A.
,
Peng, Y.
,
Van Benthem, K.
,
Shibata, N.
,
Dravid, V. P.
,
Prabhumirashi, P.
,
Findlay, S. D.
,
Oxley, M. P.
,
Allen, L. J.
,
Dell
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 1.78 MB
Your tags:
english, 2004
21
Erosion of TEM Specimens in an Intense Electron Beam
Egerton, R. F.
,
Crozier, P. A.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 155 KB
Your tags:
english, 2004
22
Aberration correction: Some Advantages and Alternatives
Dunin-Borkowski, R. E.
,
Kasama, T.
,
Cervera, L.
,
Twitchett, A. C.
,
Midgley, P. A.
,
Robins, A. C.
,
Smith, D. W.
,
Gronsky, J. J.
,
Thomas, C. M.
,
Fischione, P. E.
,
Hetherington, C. J. D.
,
Kirkland, A. I.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 827 KB
Your tags:
english, 2004
23
Magnetic Imaging of Information Storage Materials
Petford-Long, A. K.
,
Brown, H. L.
,
Hodge, G.
,
Warot, B.
,
Keif, M. T.
,
Nickel, J.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 263 KB
Your tags:
english, 2004
24
In Situ PEEL Spectroscopic Determination and EFTEM Imaging of Multiple Materials Properties at the Nanoscale Using Universality and Scaling in Solid-State Property-Plasmon Energy Relationships: New Capabilities for Analytical Electron Microscopy
Oleshko, Vladimir P.
,
Howe, James M.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 388 KB
Your tags:
english, 2004
25
The Possibility of TEM-based X-ray Microanalysis with a Microcalorimeter Detector
Kenik, E. A.
,
Anderson, I. M.
,
Joy, D. C.
,
Demers, H.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 331 KB
Your tags:
english, 2004
26
Atomic Resolution Electron Tomography: A Dream?
Van Dyck, D.
,
Van Aert, S.
,
Croitoru, M.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 158 KB
Your tags:
english, 2004
27
SCEM and XEDS in the Next Generation Aberration Corrected Microscopes
Zaluzec, Nestor J.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 522 KB
Your tags:
english, 2004
28
Outlook of Application of Aberration Corrected-Electron Microscopy in the Ligandprotected Metal Clusters
Xu, Huiping
,
Twesten, Ray D.
,
Menard, Laurent
,
Frenkel, Anatoly
,
Nuzzo, Ralph
,
Johnson, Duane
,
Yang, Judith C.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 563 KB
Your tags:
english, 2004
29
Monochromated ELS: History, Context and Opportunities
Spence, J. C. H.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 236 KB
Your tags:
english, 2004
30
Sub-[Angstrom capital A, ring]ngstrom and sub-eV resolution with the analytical SATEM
Benner, G.
,
Matijevic, M.
,
Orchowski, A.
,
Schlossmacher, P.
,
Thesen, A.
,
Haider, M.
,
Hartel, P.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 487 KB
Your tags:
english, 2004
31
Prospects for Aberration Corrected Nanocrystallogrphy
Marks, L. D.
,
Own, C. S.
,
Sinkler, W.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 57 KB
Your tags:
english, 2004
32
A New Double-Corrected HREM/STEM and its Applications for Advanced Materials
Hutchison, J. L.
,
Titchmarsh, J. M.
,
Cockayne, D. J. H.
,
Hetherington, C. J. D.
,
Kirkland, A. I.
,
Doole, R. M.
,
Sawada, H.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 489 KB
Your tags:
english, 2004
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