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Radiation Hardened by Design RF Circuits Implemented in 0.13 $\mu$m CMOS Technology
Chen, W., Pouget, V., Gentry, G. K., Barnaby, H. J., Vermeire, B., Bakkaloglu, B., Kiaei, S., Holbert, K. E., Fouillat, P.Volume:
53
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2006.885009
Date:
December, 2006
File:
PDF, 626 KB
english, 2006