Heavy-Ion Induced Charge Yield in MOSFETs
Javanainen, Arto, Schwank, James R., Shaneyfelt, Marty R., Harboe-Sorensen, Reno, Virtanen, Ari, Kettunen, H., Dalton, Scott M., Dodd, Paul E., Jaksic, Aleksandar B.Volume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2009.2033687
Date:
December, 2009
File:
PDF, 490 KB
english, 2009