Comparisons of soft error rate for srams in commercial soi...

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

Comparisons of soft error rate for srams in commercial soi and bulk below the 130-nm technology node

Roche, P., Gasiot, G., Forbes, K., O'Sullivan, V., Ferlet, V.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2003.821588
Date:
December, 2003
File:
PDF, 1.01 MB
english, 2003
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