Radiation effects at cryogenic temperatures in Si-JFET,...

IEEE Transactions on Nuclear Science 1995 / Dec. Vol. 42; Iss. 6

Radiation effects at cryogenic temperatures in Si-JFET, GaAs MESFET, and MOSFET devices

Citterio, M., Rescia, S., Radeka, V.
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Volume:
42
Language:
english
Pages:
5
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.489425
Date:
January, 1995
File:
PDF, 636 KB
english, 1995
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