Volume 42; Issue 6

IEEE Transactions on Nuclear Science

Volume 42; Issue 6

1

Single-event gate-rupture in power MOSFETs: prediction of breakdown biases and evaluation of oxide thickness dependence

Allenspach, M., Mouret, I., Titus, J.L., Wheatley, C.F., Pease, R.L., Brews, J.R., Schrimpf, R.D., Galloway, K.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 630 KB

english, 1995

2

Charged particle radiation effects on bulk silicon and SIMOX SOI photodiodes

Kalkhoran, N.M., Burke, E.A., Namavar, F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 651 KB

english, 1995

3

Heavy ion SEU immunity of a GaAs complementary HIGFET circuit fabricated on a low temperature grown buffer layer

Marshall, P.W., Dale, C.J., Weatherford, T., Carts, M., McMorrow, D., Peczalski, A., Baier, S., Nohava, J., Skogen, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 659 KB

english, 1995

4

A fast, low power CMOS amplifier on SOI for sensor applications in a radiation environment of up to 20 Mrad(Si)

Aspell, P., Faccio, F., Jarron, P., Heijine, E.H.M., Borel, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 626 KB

english, 1995

5

Effect of rapid thermal annealing on radiation hardening of MOS devices

Flament, O., Leray, J.L., Martin, F., Orsier, E., Pelloie, J.L., Truche, R., Devine, R.A.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 685 KB

english, 1995

6

Further development of the Heavy Ion Cross section for single event UPset: model (HICUP)

Connell, L.W., Sexton, F.W., Prinja, A.K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 793 KB

english, 1995

7

Dose rate and annealing effects on total dose response of MOS and bipolar circuits

Carriere, T., Beaucour, J., Gach, A., Johlander, B., Adams, L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 799 KB

english, 1995

8

Elimination of charge-enhancement effects in GaAs FETs with a low-temperature grown GaAs buffer layer

McMorrow, D., Weatherford, T.R., Curtice, W.R., Knudson, A.R., Buchner, S., Melinger, J.S., Lan Hu Tran,, Campbell, A.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 760 KB

english, 1995

9

A feature-based approach to monitor motor-operated valves used in nuclear power plants

Mukhopadhyay, S., Chaudhuri, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.26 MB

english, 1995

10

Comparison of ionizing-radiation-induced gain degradation in lateral, substrate, and vertical PNP BJTs

Schmidt, D.M., Fleetwood, D.M., Schrimpf, R.D., Pease, R.L., Graves, R.J., Johnson, G.H., Galloway, K.F., Combs, W.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.05 MB

english, 1995

11

Non-proportionality in the scintillation response and the energy resolution obtainable with scintillation crystals

Dorenbos, P., de Haas, J.T.M., van Eijk, C.W.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.46 MB

english, 1995

12

Radiation effects at cryogenic temperatures in Si-JFET, GaAs MESFET, and MOSFET devices

Citterio, M., Rescia, S., Radeka, V.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 636 KB

english, 1995

13

Further measurements of random telegraph signals in proton irradiated CCDs

Hopkins, I.H., Hopkinson, G.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 953 KB

english, 1995

14

MOSFET dosimeters: the role of encapsulation on dosimetric characteristics in mixed gamma-neutron and megavoltage X-ray fields

Rosenfeld, A.B., Carolan, M.C., Kaplan, G.I., Allen, B.J., Khivrich, V.I.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1016 KB

english, 1995

15

Critical charge concepts for CMOS SRAMs

Dodd, P.E., Sexton, F.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 960 KB

english, 1995

16

Comparison and implications of charge collection measurements in silicon and InGaAs irradiated by energetic protons and neutrons

Normand, E., Oberg, D.L., Wert, J.L., Majewski, P.P., Woffinden, G.A., Satoh, S., Sasaki, K., Tverskoy, M.G., Miroshkin, V.V., Goleminov, N., Wender, S.A., Gavron, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 926 KB

english, 1995

17

Test CMOS/SOS RAM for transient radiation upset comparative research and failure analysis

Nikiforov, A.Y., Poljakov, I.V.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 670 KB

english, 1995

18

Effects of interface traps and border traps on MOS postirradiation annealing response

Fleetwood, D.M., Warren, W.L., Schwank, J.R., Winokur, P.S., Shaneyfelt, M.R., Riewe, L.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.21 MB

english, 1995

19

Application of a diffusion model to SEE cross sections of modern devices [DRAMs]

Smith, E.C., Stassinopoulos, E.G., LaBel, K., Brucker, G., Seidlick, C.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 865 KB

english, 1995

20

Hardness-assurance issues for lateral PNP bipolar junction transistors

Schrimpf, R.D., Graves, R.J., Schmidt, D.M., Fleetwood, D.M., Pease, R.L., Combs, W.E., DeLaus, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 950 KB

english, 1995

21

Electron spin resonance evidence that E'/sub γ/ centers can behave as switching oxide traps

Conley, J.F., Lenahan, P.M., Lelis, A.J., Oldham, T.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 780 KB

english, 1995

22

Particle dependence of the gallium vacancy production in irradiated n-type gallium arsenide

Khanna, S.M., Jorio, A., Carlone, C., Parenteau, M., Houdayer, A., Gerdes, J.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 999 KB

english, 1995

23

The energy dependence of lifetime damage constants in GaAs LEDs for 1-500 MeV protons

Barry, A.L., Houdayer, A.J., Hinrichsen, P.F., Letourneau, W.G., Vincent, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 381 KB

english, 1995

24

Characterization of a fully resonant, 1-MHz, 25-Watt, DC/DC converter fabricated in a rad-hard BiCMOS/high-voltage process

Titus, J.L., Gehlhausen, M.A., Desko, J.C., Nguyen, T.T., Shibib, M.A., Hollenbach, K.E., Roberts, D.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 805 KB

english, 1995

25

Alpha particle simulation of space radiation damage effects in semiconductor devices

Colerico, C.W., Serreze, H.B., Messenger, S.R., Xapsos, M.A., Burke, E.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 590 KB

english, 1995

26

Integrated environmental monitoring system for spacecraft

Bogorad, A., Bowman, C., Dennis, A., Beck, J., Lang, D., Herschitz, R., Buehler, M., Blaes, B., Martin, D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 702 KB

english, 1995

27

Enhanced damage in linear bipolar integrated circuits at low dose rate

Johnston, A.H., Rax, B.G., Lee, C.I.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.18 MB

english, 1995

28

SEU results from the Advanced Photovoltaic and Electronics eXperiments (APEX) satellite

Mullen, E.G., Ray, K.P., Koga, R., Holeman, E.G., Delorey, D.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 677 KB

english, 1995

29

Impact of oxide thickness on SEGR failure in vertical power MOSFETs; development of a semi-empirical expression

Titus, J.L., Wheatley, C.F., Burton, D.I., Mouret, I., Allenspach, M., Brews, J., Schrimpf, R., Galloway, K., Pease, R.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 598 KB

english, 1995

30

Analytic approximation for charge current and deposition by 0.1 to 100 MeV electrons in thick slabs

Frederickson, A., Bell, J., Beidl, E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.01 MB

english, 1995

31

Trapping-detrapping properties of irradiated ultra-thin SIMOX buried oxides

Paillet, P., Autran, J.-L., Leray, J.-L., Aspar, B., Auberton-Herve, A.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 647 KB

english, 1995

32

Adjoint electron-photon transport Monte Carlo calculations with ITS

Lorence, L.J., Kensek, R.P., Halbleib, J.A., Morel, J.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 788 KB

english, 1995

33

Decay correction methods in dynamic PET studies

Kewei Chen,, Reiman, E., Lawson, M., Dagan Feng,, Sung-Cheng Huang,

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 734 KB

english, 1995

34

Effects of electron beam irradiation on transient photoluminescence measurements of GaAs and AlGaAs double heterostructures

Moss, S.C., Halle, L.F., Marvin, D.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 896 KB

english, 1995

35

Influence of solar cycle on SPOT-1,-2,-3 upset rates

Ecoffet, R., Prieur, M., Del Castillo, M.F., Duzellier, S., Falguere, D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 472 KB

english, 1995

36

Adaptive entropy constrained transform coding of magnetic resonance image sequences

Mohsenian, N., Nosratinia, A., Bede Liu,, Orchard, M.T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1022 KB

english, 1995

37

Bulk trap formation by high temperature annealing of buried thermal oxides [SIMOX]

Stahlbush, R.E., Brown, G.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.30 MB

english, 1995

38

An analog random access memory in the AVLSI-RA process for an interpolating pad chamber

Britton, C.L., Wintenberg, A.L., Read, K.F., Clonts, L.G., Kennedy, E.J., Smith, R.S., Swann, B.K., Musser, J.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 490 KB

english, 1995

39

Some aspects of application of the two parameter SEU model

Miroshkin, V.V., Tverskoy, M.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 620 KB

english, 1995

40

Temporal analysis of SEU in SOI/GAA SRAMs

Francis, P., Colinge, J.-P., Berger, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.22 MB

english, 1995

41

Reaction of truncation artifacts in fan beam transmission imaging using a spatially varying gamma prior

Case, J.A., Tin-Su Pan,, King, M.A., Der-Shan Luo,, Penney, B.C., Rabin, M.S.Z.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 894 KB

english, 1995

42

Energy-spectral Compton scatter imaging. I. Theory and mathematics

Arendtsz, N.V., Hussein, E.M.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.63 MB

english, 1995

43

Relaxation of Si-SiO/sub 2/ interfacial stress in bipolar screen oxides due to ionizing radiation

Witczak, S.C., Galloway, K.F., Schrimpf, R.D., Suehle, J.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.09 MB

english, 1995

44

Characterization and qualification of a neutron irradiation environment for neutron hardness assurance testing of electronic devices

Bennion, J.S., Sandquist, C.M., Kelly, J.C., Griffin, P.J., Sheehan, P.S., Saxey, B.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.08 MB

english, 1995

45

Using linear time-invariant system theory to estimate kinetic parameters directly from projection measurements

Zeng, G.L., Gullberg, G.T., Huesman, R.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 729 KB

english, 1995

46

Simulating total-dose and dose-rate effects on digital microelectronics timing delays using VHDL

Brothers, C.P., Pugh, R.D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 826 KB

english, 1995

47

An investigation of dual energy transmission measurements in simultaneous transmission emission imaging

Welch, A., Gullberg, G.T., Christian, P.E., Jia Li,, Tsui, B.M.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.05 MB

english, 1995

48

SEE results using high energy ions

Duzellier, S., Falguere, D., Mouliere, L., Ecoffet, R., Buisson, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 631 KB

english, 1995

49

Ion induced charge collection and SEU sensitivity of emitter coupled logic (ECL) devices

Koga, R., Crain, W.R., Hansel, S.J., Crawford, K.B., Kirshman, J.F., Pinkerton, S.D., Penzin, S.H., Moss, S.C., Maher, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 642 KB

english, 1995

50

A model for plant power maneuverability and its application to a limitation system

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 755 KB

english, 1995

51

Energy-spectral Compton scatter imaging. II. Experiments

Arendtsz, N.V., Hussein, E.M.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 930 KB

english, 1995

52

Calibrations and corrections of a modular cylindrical SPECT system (McSPECT-II)

Yongjie Jin,, Jingai Liu,, Wei Chang,, Yinong Liu,, Gang Huang,

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 813 KB

english, 1995

53

High-speed camera with a back-thinned 16-port frame transfer CCD sensor

Turko, B.T., Yates, G.J., Albright, K.L., Pena, C.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 458 KB

english, 1995

54

Charge trapping versus buried oxide thickness for SIMOX structures

Lawrence, R.K., Ioannou, D.E., Hughes, H.L., McMarr, P.J., Mrstik, B.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 697 KB

english, 1995

55

Radiation evaluation of an advanced 64 Mb 3.3 V DRAM and insights into the effects of scaling on radiation hardness

Shaw, D.C., Swift, G.M., Johnston, A.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 721 KB

english, 1995

56

Scintillating LXe/LKr electromagnetic calorimeter

Akimov, D.Yu., Bolozdynya, A.J., Churakov, D.L., Afonasyev, V.N., Belogurov, S.G., Brastilov, A.D., Burenkov, A.A., Gusev, L.N., Kuzichev, V.F., Lebedenko, V.N., Osipova, T.A., Rogovsky, I.A., Safrono

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 571 KB

english, 1995

57

Chronology of generation, variation, and disappearance of a second proton belt as determined by effects in electronic devices

Stassinopoulos, E.G., Brucker, G.J., Stauffer, C.A., Meulenberg, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 857 KB

english, 1995

58

Comparison of forming gas, nitrogen, and vacuum anneal effects on X-ray irradiated MOSFETs

Pagey, M.P., Milanowski, R.J., Henegar, K.T., Bhuva, B.L., Kerns, S.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 728 KB

english, 1995

59

Evaluation of the upset risk in CMOS SRAM through full three dimensional simulation

Moreau, Y., Duzellier, S., Gasiot, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 818 KB

english, 1995

60

The CESR multi-mission radiation monitor

Boer, M., Naya, J., Chabaud, J.-P., Ehanno, M., Rouaix, G., Baiget, A., Ecoffet, R., Labrunee, M., Calvel, P., Reveret, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 673 KB

english, 1995

61

Study of MOV operator and motor characteristics to determine torque capability

Hussain, B., Behera, K., Alsammarae, A.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 394 KB

english, 1995

62

An analysis of correction methods for emission contamination in PET postinjection transmission measurement

Luk, W.R., Digby, W.D., Jones, W.F., Casey, M.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 624 KB

english, 1995

63

Ionizing radiation-induced asymmetries of the retention characteristics of ferroelectric thin films

Moore, R.A., Benedetto, J.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.15 MB

english, 1995

64

Effect of electron traps on reversibility of annealing

Pershenkov, V.S., Belyakov, V.V., Cherepko, S.V., Nikiforov, A.Y., Sogoyan, A.V., Ulimov, V.N., Emelianov, V.V.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 881 KB

english, 1995

65

A Monte Carlo method using octree structure in photon and electron transport

Ogawa, K., Maeda, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 587 KB

english, 1995

66

Effect of post oxidation anneal on VUV radiation-hardness of the Si/SiO/sub 2/ system studied by positron annihilation spectroscopy

Clement, M., de Nijs, J.M.M., van Veen, A., Schut, H., Balk, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 981 KB

english, 1995

67

The effect of power supply voltage scaling on the total dose radiation response of fully-depleted SOI MOS transistors

Liu, S.T., Jenkins, W.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 447 KB

english, 1995

68

Highly flexible PC-based data acquisition system for TOF measurements with pulsed neutron beams

Muller, K.D., Alefeld, B., Lerch, J., Reinartz, R., Reinhart, P., Rongen, F., Schelten, J., Tenten, W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 500 KB

english, 1995

69

A new efficient algorithmic-based SEU tolerant system architecture

Blaquiere, Y., Gagne, G., Savaria, Y., Evequoz, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 811 KB

english, 1995

70

Ionizing radiation tolerance of high-performance SiGe HBT's grown by UHV/CVD

Babcock, J.A., Cressler, J.D., Vempati, L.S., Clark, S.D., Jaeger, R.C., Harame, D.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.08 MB

english, 1995

71

Single event upsets in gallium arsenide pseudo-complementary MESFET logic

Fouts, D.J., Weatherford, T.R., McMorrow, D., Wolfe, K., Van Dyk, S.E., Melinger, J.S., Tran, L.H., Campbell, A.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.28 MB

english, 1995

72

Correction to "Shower Counters for SLAG Experiments E142/E143" [Erratum]

Borel, H., Grenier, P., LeMeur, J., Lombard, R., Logol, J.C., Marroncle, J., Morgenstern, J., Mouly, J.P., Paul, B., Staley, F., Terrien, Y., Breton, V., Comptour, C., Crouau, M., Fonvielle, H., Robli

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 166 KB

english, 1995

73

A high-sensitivity neutron dosimeter using the coherent demodulation technique

Horiuchi, N., Sato, T., Kobayashi, E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 568 KB

english, 1995

74

Electron and hole trapping in doped oxides

Warren, W.L., Shaneyfelt, M.R., Fleetwood, D.M., Winokur, P.S., Montague, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 925 KB

english, 1995

75

Implications of single event effect characterization of hybrid DC-DC converters and a solid state power controller

LaBel, K.A., Barry, R.K., Castell, K., Kim, H.S., Seidleck, C.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 589 KB

english, 1995

76

Charge collection in GaAs MESFETs fabricated in semi-insulating substrates

Schwank, J.R., Sexton, F.W., Weatherford, T.R., McMorrow, D., Knudson, A.R., Melinger, J.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 708 KB

english, 1995

77

An automatic method to determine cutoff frequency based on image power spectrum [SPECT]

Beis, J.S., Celler, A., Barney, J.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 758 KB

english, 1995

78

Dose rate and total dose dependence of the 1/f noise performance of a GaAs operational amplifier during irradiation

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 825 KB

english, 1995

79

SEU fault tolerance in artificial neural networks

Velazco, R., Assoum, A., Radi, N.E., Ecoffet, R., Botey, X.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 836 KB

english, 1995

80

IBM Thinkpad radiation testing and recovery during EUROMIR missions

Martignano, M., Harboe-Sorensen, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 703 KB

english, 1995

81

Effects of geometry on the proton SEU dependence on the angle of incidence

Reed, R.A., McNulty, P.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 524 KB

english, 1995

82

Effects of ion damage on IBICC and SEU imaging

Sexton, F.W., Horn, K.M., Doyle, B.L., Shaneyfelt, M.R., Meisenheimer, T.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 912 KB

english, 1995

83

Performance analysis based on a Monte Carlo simulation of a liquid xenon PET detector

Lopes, M.I., Chepel, V., Carvalho, J.C., Ferreira Marques, R., Policarpo, A.J.P.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 448 KB

english, 1995

84

Effects of target fragmentation on evaluation of LET spectra from space radiation in low-earth orbit (LEG) environment: impact on SEU predictions

Shinn, J.L., Cucinotta, F.A., Wilson, J.W., Badhwar, G.D., O'Neill, P.M., Badavi, F.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 856 KB

english, 1995

85

Hardness assurance and testing techniques for high resolution (12- to 16-bit) analog-to-digital converters

Lee, C.I., Rax, B.G., Johnston, A.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 863 KB

english, 1995

86

Electron spin resonance analysis of EP center interactions with H/sub 2/: evidence for a localized EP center structure

Conley, J.F., Lenahan, P.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 417 KB

english, 1995

87

Characterization method for ionizing radiation degradation in power MOSFETs

de la Bardonnie, M., Maouad, A., Mialhe, P., Elmazria, O., Hoffmann, A., Lepley, B., Charles, J.-P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 600 KB

english, 1995

88

Simulation aided hardening of N-channel power MOSFETs to prevent single event burnout

Dachs, C., Roubaud, F., Palau, J.-M., Bruguier, G., Gasiot, J., Tastet, P., Calvett, M.-C., Calvel, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 538 KB

english, 1995

89

Particle-induced mitigation of SEU sensitivity in high data rate GaAs HIGFET technologies

Marshall, P.W., Dale, C.J., Weatherford, T.R., La Macchia, M., LaBel, K.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 583 KB

english, 1995

90

A simulation to model position encoding multicrystal PET detectors

Tsang, G., Moisan, C., Rogers, J.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 918 KB

english, 1995

91

Measurement of the radiation environment from LEO to GTO using the CREAM and CREDO experiments

Dyer, C.S., Sims, A.J., Truscott, P.R., Peerless, C., Watson, C., Underwood, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 833 KB

english, 1995

92

An SEU analysis approach for error propagation in digital VLSI CMOS ASICs

Baze, M.P., Buchner, S., Bartholet, W.G., Dao, T.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 586 KB

english, 1995

93

Radiation hardness of pn-CCDs for X-ray astronomy

Meidinger, N., Struder, L., Soltau, H., von Zanthier, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 675 KB

english, 1995

94

A rigorous treatment of self-shielding and covers in neutron spectra determinations

Griffin, P.J., Kelly, J.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 921 KB

english, 1995

95

Degradation of Si/sub 1-x/Ge/sub x/ epitaxial heterojunction bipolar transistors by 1-MeV fast neutrons

Ohyama, H., Vanhellemont, J., Takami, Y., Hayama, K., Sunaga, H., Poortmans, J., Caymax, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 821 KB

english, 1995

96

Use of MOS structures for the investigation of low-dose-rate effects in bipolar transistors

Belyakov, V.V., Pershenkov, V.S., Shalnov, A.V., Shvetzov-Shilovsky, I.N.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 728 KB

english, 1995

97

VXI electronics for EUROGAM clover detectors

Lazarus, I., Coleman-Smith, P.J., Thornhill, J., Bosson, G., Karkour, N., Richard, A., Zojceski, Z., Ring, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 601 KB

english, 1995

98

SEE rate calculations using the effective flux approach and a generalized figure of merit approximation

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 925 KB

english, 1995

99

Potential enhancement of warm X-ray dose from a reflexing bremsstrahlung diode

Sanford, T.W.L., Halbleib, J.A., Cooperstein, G., Weber, B.V.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 866 KB

english, 1995

100

High-energy heavy-ion-induced charge transport across multiple junctions

Dussault, H., Howard, J.W., Block, R.C., Stapor, W.J., Knudson, A.R., McDonald, P.T., Pinto, M.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.11 MB

english, 1995

101

Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures

Moss, S.C., LaLumondiere, S.D., Scarpulla, J.R., MacWilliams, K.P., Crain, W.R., Koga, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.16 MB

english, 1995

102

An ISPA-camera for gamma rays

Puertolas, D., Piedigrossi, D., Pani, R., Leutz, H., de Notaristefani, F., D'Ambrosio, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 869 KB

english, 1995

103

Low altitude edge of the inner radiation belt: dose models from the APEX satellite

Gussenhoven, M.S., Mullen, G., Hardy, D.A., Madden, D., Holeman, E., Delorey, D., Hanser, F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 831 KB

english, 1995

104

Plastic packaging and burn-in effects on ionizing dose response in CMOS microcircuits

Clark, S.D., Bings, J.P., Maber, M.C., Williams, M.K., Alexander, D.R., Pease, R.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 860 KB

english, 1995

105

A new solar flare heavy ion model and its implementation through MACREE, an improved modeling tool to calculate single event effect rates in space

Majewski, P.P., Normand, E., Oberg, D.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 882 KB

english, 1995

106

A low-cost, highly reliable SEU-tolerant SRAM: prototype and test results

Calin, T., Vargas, F., Nicolaidis, M., Velazco, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 699 KB

english, 1995

107

Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX

Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 1.19 MB

english, 1995

108

Outstanding Conference Paper Award 1995 IEEE Nuclear and Space Radiation Effects Conference

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 410 KB

english, 1995

109

1995 Index IEEE Transactions on Nuclear Science Vol. 42

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 5.88 MB

english, 1995

110

Conference Author Index

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 163 KB

english, 1995

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