Ratcheting behavior of sandwiched assembly joined by sintered nanosilver for power electronics packaging
Chen, Gang, Zhang, Ze-Sheng, Mei, Yun-Hui, Li, Xin, Lu, Guo-Quan, Chen, XuVolume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2012.11.011
Date:
April, 2013
File:
PDF, 1009 KB
english, 2013