Scaling limits of resistive memories

Nanotechnology 2011 / 06 Vol. 22; Iss. 25

Scaling limits of resistive memories

Zhirnov, Victor V, Meade, Roy, Cavin, Ralph K, Sandhu, Gurtej
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Volume:
22
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/22/25/254027
Date:
June, 2011
File:
PDF, 1.55 MB
english, 2011
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