Intrinsic stress in thin films deposited on anisotropic...

Intrinsic stress in thin films deposited on anisotropic substrates and its influence on the natural frequencies of piezoelectric resonators

Tiersten, H. F.
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Volume:
52
Year:
1981
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.329495
File:
PDF, 1.07 MB
english, 1981
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