Influence of Interface Traps on the Temperature Sensitivity of MOSFET Drain-Current Variations
Appaswamy, Aravind, Chakraborty, Partha, Cressler, John DVolume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2010.2041892
Date:
May, 2010
File:
PDF, 302 KB
english, 2010