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AlGaN/GaN MIS-gate HEMTs with SiCN gate stacks
Kobayashi, K., Kano, M., Yoshida, T., Katayama, R., Matsuoka, T., Otsuji, T., Suemitsu, T.Volume:
10
Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201200609
Date:
May, 2013
File:
PDF, 1.88 MB
english, 2013