See characterization of vertical dmosfets: an updated test...

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

See characterization of vertical dmosfets: an updated test protocol

Titus, J.L., Wheatley, C.F.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2003.820733
Date:
December, 2003
File:
PDF, 1.71 MB
english, 2003
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