![](/img/cover-not-exists.png)
Sensitivity of Threshold Voltage to Nanowire Width Variation in Junctionless Transistors
Choi, Sung-Jin, Moon, Dong-Il, Kim, Sungho, Duarte, Juan P., Choi, Yang-KyuVolume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2010.2093506
Date:
February, 2011
File:
PDF, 338 KB
english, 2011