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Structure characterization of hard materials by precession electron diffraction and automatic diffraction tomography: 6H–SiC semiconductor and Ni 1+ x Te 1 embedded nanodomains
Sarakinou, E, Mugnaioli, E, Lioutas, Ch B, Vouroutzis, N, Frangis, N, Kolb, U, Nikolopoulos, SVolume:
27
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/27/10/105003
Date:
October, 2012
File:
PDF, 970 KB
english, 2012