Contactless ultra-fast laser probing of radiation-induced...

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

Contactless ultra-fast laser probing of radiation-induced leakage current in ultra-thin oxides

Pasternak, R., Chatterjee, A., Shirokaya, Y.V., Choi, B.K., Marka, Z., Miller, J.K., Albridge, R.G., Rashkeev, S.N., Pantelides, S.T., Schrimpf, R.D., Fleetwood, D.M., Tolk, N.H.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2003.821387
Date:
December, 2003
File:
PDF, 306 KB
english, 2003
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