Charge separation techniques for irradiated pseudo-mos soi...

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

Charge separation techniques for irradiated pseudo-mos soi transistors

Jun, B., Fleetwood, D.M., Schrimpf, R.D., Zhou, X., Montes, E.J., Cristoloveanu, S.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2003.821380
Date:
December, 2003
File:
PDF, 382 KB
english, 2003
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