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Substrate removal and box thinning effects on total dose response of FDSOI NMOSFET
Gouker, P., Burns, J., Wyatt, P., Warner, K., Austin, E., Milanowski, R.Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2003.821822
Date:
December, 2003
File:
PDF, 859 KB
english, 2003