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A 12.5-Gb/s On-Chip Oscilloscope to Measure Eye Diagrams and Jitter Histograms of High-Speed Signals
Dehlaghi, Behzad, Magierowski, Sebastian, Belostotski, LeonidVolume:
22
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2013.2265895
Date:
May, 2014
File:
PDF, 4.43 MB
english, 2014