Light-Weight On-Chip Structure for Measuring Timing...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2014 / 5 Vol. 22; Iss. 5

Light-Weight On-Chip Structure for Measuring Timing Uncertainty Induced by Noise in Integrated Circuits

Shuo Wang,, Tehranipoor, Mohammad
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Volume:
22
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2013.2263812
Date:
May, 2014
File:
PDF, 1.38 MB
english, 2014
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