Current Collapse in AlGaN/GaN HEMTs Investigated by Electrical and Optical Characterizations
T. Mizutani, Y. Ohno, M. Akita, S. Kishimoto, K. MaezawaVolume:
194
Year:
2002
Language:
english
Pages:
5
DOI:
10.1002/1521-396x(200212)194:23.0.co;2-7
File:
PDF, 181 KB
english, 2002