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Influence of Process Technology on DC-Performance of GaN-Based HFETs
D. Mistele, T. Rotter, Z. Bougrioua, M. Marso, H. Roll, H. Klausing, F. Fedler, O. Semchinova, I. Moerman, J. GraulVolume:
194
Year:
2002
Language:
english
Pages:
4
DOI:
10.1002/1521-396x(200212)194:23.0.co;2-n
File:
PDF, 324 KB
english, 2002