High Quality GaN Grown by Facet-Controlled ELO (FACELO) Technique
H. Miyake, R. Takeuchi, K. Hiramatsu, H. Naoi, Y. Iyechika, T. Maeda, T. Riemann, F. Bertram, J. ChristenVolume:
194
Year:
2002
Language:
english
Pages:
5
DOI:
10.1002/1521-396x(200212)194:23.0.co;2-b
File:
PDF, 388 KB
english, 2002