Mapping evaluation of damage effect on electrical...

Journal of Crystal Growth 1990 Vol. 103; Iss. 1-4

Mapping evaluation of damage effect on electrical properties of GaAs Schottky contacts

Kenji Shiojima, Tsugunori Okumura
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Volume:
103
Year:
1990
Language:
english
Pages:
9
DOI:
10.1016/0022-0248(90)90194-p
File:
PDF, 575 KB
english, 1990
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