Gate-Stack Engineering in $n$-Type Ultrascaled Si Nanowire...

IEEE Transactions on Electron Devices 2013 / 10 Vol. 60; Iss. 10

Gate-Stack Engineering in $n$-Type Ultrascaled Si Nanowire Field-Effect Transistors

Luisier, Mathieu, Schenk, Olaf
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2278573
Date:
October, 2013
File:
PDF, 394 KB
english, 2013
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