SEE and TID Characterization of an Advanced Commercial...

IEEE Transactions on Nuclear Science 2006 / 12 Vol. 53; Iss. 6

SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory

Oldham, T. R., Ladbury, R. L., Friendlich, M., Kim, H. S., Berg, M. D., Irwin, T. L., Seidleck, C., LaBel, K. A.
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Volume:
53
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2006.885843
Date:
December, 2006
File:
PDF, 172 KB
english, 2006
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