Defects at Ge/oxide and III–V/oxide interfaces

Microelectronic Engineering 2013 / 09 Vol. 109

Defects at Ge/oxide and III–V/oxide interfaces

Van de Walle, C.G., Choi, M., Weber, J.R., Lyons, J.L., Janotti, A.
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Volume:
109
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2013.03.151
Date:
September, 2013
File:
PDF, 546 KB
english, 2013
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