Proton nonionizing energy loss (niel) for device...

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

Proton nonionizing energy loss (niel) for device applications

Insoo Jun,, Xapsos, M.A., Messenger, S.R., Burke, E.A., Walters, R.J., Summers, G.P., Jordan, T.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2003.820760
Date:
December, 2003
File:
PDF, 303 KB
english, 2003
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