Hot-Carrier Stress Effect on a CMOS 65-nm 60-GHz One-Stage...

IEEE Electron Device Letters 2010 / 09 Vol. 31; Iss. 9

Hot-Carrier Stress Effect on a CMOS 65-nm 60-GHz One-Stage Power Amplifier

Quemerais, Thomas, Moquillon, Laurence, Huard, Vincent, Fournier, Jean-Michel, Benech, Philippe, Corrao, Nicolas, Mescot, Xavier
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Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2010.2055535
Date:
September, 2010
File:
PDF, 163 KB
english, 2010
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