AlGaN/GaN HEMT Degradation: An Electro-Thermo-Mechanical...

IEEE Transactions on Electron Devices 2013 / 10 Vol. 60; Iss. 10

AlGaN/GaN HEMT Degradation: An Electro-Thermo-Mechanical Simulation

der Maur, Matthias Auf, Di Carlo, Aldo
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2267547
Date:
October, 2013
File:
PDF, 1.08 MB
english, 2013
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