Evaluation of Electron Trapping Speed of AlGaN/GaN HEMT With Real-Time Electroluminescence and Pulsed $I{-}V$ Measurements
Wakejima, Akio, Wilson, Amalraj Frank, Mase, Suguru, Joka, Takuya, Egawa, TakashiVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2273796
Date:
October, 2013
File:
PDF, 1.78 MB
english, 2013