On the Origin of Kink Effect in Current–Voltage Characteristics of AlGaN/GaN High Electron Mobility Transistors
Kaushik, Janesh K., Balakrishnan, V. Raman, Panwar, Brishbhan Singh, Muralidharan, RangarajanVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2279158
Date:
October, 2013
File:
PDF, 1.24 MB
english, 2013