Current Stability in Multi-Mesa-Channel AlGaN/GaN HEMTs
Ohi, Kota, Asubar, Joel Tacla, Nishiguchi, Kenya, Hashizume, TamotsuVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2266663
Date:
October, 2013
File:
PDF, 1.59 MB
english, 2013