Junction Isolation Single Event Radiation Hardening of a...

IEEE Transactions on Nuclear Science 2009 / 12 Vol. 56; Iss. 6

Junction Isolation Single Event Radiation Hardening of a 200 GHz SiGe:C HBT Technology Without Deep Trench Isolation

Diestelhorst, Ryan M., Phillips, Stanley D., Appaswamy, Aravind, Sutton, Akil K., Cressler, John D., Pellish, Jonath, Reed, Robert A., Vizkelethy, Gyorgy, Marshall, Paul W., Gustat, Hans, Heinemann, B
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Volume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2009.2030801
Date:
December, 2009
File:
PDF, 1.18 MB
english, 2009
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