Impact of Low-Energy Proton Induced Upsets on Test Methods...

IEEE Transactions on Nuclear Science 2009 / 12 Vol. 56; Iss. 6

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

Sierawski, Brian D., Pellish, Jonathan A., Reed, Robert A., Schrimpf, Ronald D., Warren, Kevin M., Weller, Robert A., Mendenhall, Marcus H., Black, Jeffrey D., Tipton, Alan D., Xapsos, Michael A., Bau
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Volume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2009.2032545
Date:
December, 2009
File:
PDF, 870 KB
english, 2009
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