Defect evolution during catastrophic optical damage of diode lasers
Hempel, Martin, La Mattina, Fabio, Tomm, Jens W, Zeimer, Ute, Broennimann, Rolf, Elsaesser, ThomasVolume:
26
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/26/7/075020
Date:
July, 2011
File:
PDF, 1.63 MB
english, 2011