Comparative Leakage Analysis of GeOI FinFET and Ge Bulk FinFET
Hu, Vita Pi-Ho, Fan, Ming-Long, Su, Pin, Chuang, Ching-TeVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2278032
Date:
October, 2013
File:
PDF, 1.24 MB
english, 2013