TEM Observation of Crack- and Pit-Shaped Defects in...

IEEE Electron Device Letters 2008 / 10 Vol. 29; Iss. 10

TEM Observation of Crack- and Pit-Shaped Defects in Electrically Degraded GaN HEMTs

Chowdhury, U., Jimenez, J.L., Lee, C., Beam, E., Saunier, P., Balistreri, T., Seong-Yong Park,, Taehun Lee,, Wang, J., Kim, M.J., Jungwoo Joh,, del Alamo, J.A.
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Volume:
29
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2008.2003073
Date:
October, 2008
File:
PDF, 250 KB
english, 2008
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