A defect-based compact modeling approach for the...

Solid-State Electronics 2014 / 1 Vol. 91

A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuits

Esqueda, Ivan S., Barnaby, Hugh J.
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Volume:
91
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2013.10.008
Date:
January, 2014
File:
PDF, 1.09 MB
english, 2014
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