Measurement of effective carrier lifetime at the...

Solid-State Electronics 2013 / 3 Vol. 81

Measurement of effective carrier lifetime at the semiconductor–dielectric interface by Photoconductive Decay (PCD) Method

Drummond, P.J., Bhatia, D., Ruzyllo, J.
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Volume:
81
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2012.11.007
Date:
March, 2013
File:
PDF, 499 KB
english, 2013
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