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Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project
Ben Dhia, S., Boyer, A.Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.08.016
Date:
September, 2013
File:
PDF, 1.49 MB
english, 2013